George Shin currently works at Hewlett Packard’s Data Center Development Unit in Boise, Idaho. In his current role as QA/Test Manager that began in late 2009 he leads a team of developers in test responsible for integration test coverage for Enterprise Virtual Array (EVA) product, with the main focus being QA coverage of controller firmware. Prior to his QA/Test Manager role, George worked as a firmware development engineer in HP starting with Virtual Array product and later transitioning to EVA. Prior to HP he has worked as a firmware engineer in other storage product platforms from Seagate HDD, Quantum HDD and IBM ADSTAR. He has managed start-up software development teams focused on providing Hard Disk Drive test solutions for design, quality and reliability validations. George has 18+ years of R&D experience in I/O technology and storage platforms. George holds bachelor’s degrees in electrical engineering and computer science from Washington State University, and a master’s degree in electrical engineering from Cal Poly.
- Embedding Code Coverage Measurement in Multi-Platform Storage Device Without a File System - George Shin, 2011 Poster Paper, Abstract
- Continuous Integration Testing with Code Coverage - George Shin, 2011 Poster Paper, Abstract